TEST BANK FOR Computer Architecture A Quantitative Approach 4th Edition By John L. Hennessy & David Patterson

Chapter 1 Solutions Yield 1 0.7 × 1.99 4.0 + -------------------------     –4 = = 0.28 Yield 1 0.75 × 3.80 4.0 + ----------------------------     –4 = = 0.12 Yield 1 0.30 × 3.89 4.0 + ---------------------------     –4 = = 0.36 Dies per wafer π × (30 ⁄ 2)2 3.89 = ------------------------------ π × 30 sqrt(2 × 3.89) – ---------------------------------- = 182 – 33.8 = 148 Cost per die $500 148 × 0.36 = ----------...